Journal article
CBAM-enhanced lightweight CNN for wafer map defect classification
Mst. Rokeya Khatun, Fahmid Al Farid, Sharith Dhar, Md. Saiful Islam, Jia Uddin, Hezerul bin Abdul Karim
Frontiers in Electronics, 2026
- Group members
- Dr. Fahmid Al Farid
- Themes
- Deep Learning
BibTeX
@article{khatun2026cbamenhanced,
title = {{CBAM-enhanced lightweight CNN for wafer map defect classification}},
author = {Mst. Rokeya Khatun and Fahmid Al Farid and Sharith Dhar and Md. Saiful Islam and Jia Uddin and Hezerul bin Abdul Karim},
journal = {Frontiers in Electronics},
year = {2026},
doi = {10.3389/felec.2026.1750707}
}